Scanning electron microscopy (SEM) is a powerful analytical and investigative technique to evaluate a wide range of materials for surface fractures, flaws, corrosion or contaminants with the help of high-resolution magnifications. Energy dispersive x-ray spectroscopy (EDX) analysis is used to acquire additional understanding of the materials during SEM analysis process. When SEM analysis is combined with EDX analysis, a comprehensive metallurgical evaluation is attained.
SEM analysis scans a sample using a focused beam of electrons during which time the electrons produce various signals to create high magnification images of the sample’s surface topography. Using EDX analysis, metallurgical experts can study the sample in detail and provide elemental identification and quantitative compositional information of the sample. SEM and EDX analysis has a variety of applications and allows clients to understand the wear properties of a material.
Industries involved in development or manufacturing of products including microelectronics, semiconductors, medical devices, general manufacturing, insurance and litigation support, and food processing utilize the services of SEM analysis to examine the surface composition and topography of their product components. Cosmetic industry that works with small particles can also use SEM and EDX analysis to understand about the shape and size of the tiny particles.
SEM analysis can be a great tool for education and scientific studies as they create high-resolution images. Doing SEM and EDX analysis can help understand problems with particle size or shape before the products reach their consumers. If a problem is identified at a microscopic level through SEM and EDX analysis, the metallurgists can pinpoint the problem and help the clients find a solution.